Author(s): Romanyuk, Konstantin ; Luchkin, Sergey Yu. ; Ivanov, Maxim ; Kalinin, Arseny ; Kholkin, Andrei L.
Date: 2015
Persistent ID: http://hdl.handle.net/10773/20337
Origin: RIA - Repositório Institucional da Universidade de Aveiro
Subject(s): ATOMIC-FORCE MICROSCOPY; ELECTROCHEMICAL STRAIN MICROSCOPY; THERMAL NOISE; NANOSCALE; SPECTROSCOPY; CANTILEVERS; DIFFUSION; ANODES; SOLIDS; LIMIT
Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.
