High Resolution Particle Induced X-ray Emission, for short HR-PIXE, dates back to 1977 and is, therefore, nearly as old as standard PIXE itself. Until roughly ten years ago, High Resolution PIXE (HR-PIXE) work used only wavelength dispersive spectrometers (WDS). The installation, in 2008, of an X-ray Microcalorimeter Spectrometer, XMS at CTN (ITN at the time) 3MV tandetron, altered this situation and, as can be...