4 documents found, page 1 of 1
Ferroelectricity and negative piezoelectric coefficient in orthorhombic phase p...
Silva, José Pedro Basto; Istrate, Marian C.; Hellenbrand, Markus; Jan, Atif; Becker, Maximilian T.; Symonowicz, Joanna; Figueiras, Fábio G.A new approach for epitaxial stabilisation of ferroelectric orthorhombic (o-) ZrO2 films with negative piezoelectric coefficient in ∼ 8nm thick films grown by ion-beam sputtering is demonstrated. Films on (011)-Nb:SrTiO3 gave the oriented o-phase, as confirmed by transmission electron microscopy and electron backscatter diffraction mapping, grazing incidence x-ray diffraction and Raman spectroscopy. Scanning pr...
Exploring the effect of low concentration of stannum in lead-free BCT-BZT piezo...
Coondoo, Indrani; Alikin, Denis; Abramov, Alexander; Figueiras, Fábio G.; Shur, Vladimir Y.; Miranda, GeorginaPiezoelectric, ferroelectric and electromechanical properties were studied at macroscopic and local scale level in stannum doped (Ba0.88Ca0.12)(SnxZr0.1-xTi0.9)O3 ceramics, with an objective to explore the effect of low content (0 x 0.5 at%) of the substituent (Sn) on the functional properties. The results exemplified that the substitution had an influence on the crystal lattice and microstructure that affe...
Wake-up free ferroelectric rhombohedral phase in epitaxially strained ZrO2 thin...
Silva, José Pedro Basto; Negrea, Raluca F.; Istrate, Marian C.; Dutta, Sangita; Aramberri, Hugo; Íñiguez, Jorge; Figueiras, Fábio G.; Ghica, CorneliuZirconia- and hafnia-based thin films have attracted tremendous attention in the past decade because of their unexpected ferroelectric behavior at the nanoscale, which enables the downscaling of ferroelectric devices. The present work reports an unprecedented ferroelectric rhombohedral phase of ZrO2 that can be achieved in thin films grown directly on (111)-Nb:SrTiO3 substrates by ion-beam sputtering. Structura...
Narrow optical gap ferroelectric Bi2ZnTiO6 thin films deposited by RF sputtering
Figueiras, Fábio G.; Fernandes, J. Ramiro A.; Silva, J. P. B.; Alikin, Denis O.; Queirós, Eugénia C.; Bernardo, César Rui Freitas; Barcelay, Y. R.This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF-sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic ge...