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Searching for Heavy Dark Matter near the Planck Mass with XENON1T
Aprile, E.; Abe, K.; Ahmed Maouloud, S.; Althueser, L.; Andrieu, B.; Angelino, E.; Angevaare, J. R.; Antochi, V. C.; Antón Martin, D.; Arneodo, F.7 pages, 6 figures; Multiple viable theoretical models predict heavy dark matter particles with a mass close to the Planck mass, a range relatively unexplored by current experimental measurements. We use 219.4 days of data collected with the XENON1T experiment to conduct a blind search for signals from multiply interacting massive particles (MIMPs). Their unique track signature allows a targeted analysis with o...
Low-energy calibration of XENON1T with an internal 37 Ar source
Aprile, E.; Abe, K.; Agostini, F.; Ahmed Maouloud, S.; Alfonsi, M.; Althueser, L.; Andrieu, B.; Angelino, E.; Angevaare, J. R.; Antochi, V. C.A low-energy electronic recoil calibration of XENON1T, a dual-phase xenon time projection chamber, with an internal 37Ar source was performed. This calibration source features a 35-day half-life and provides two monoenergetic lines at 2.82 keV and 0.27 keV. The photon yield and electron yield at 2.82 keVare measured to be (32.3±0.3) photons/keV and (40.6 ± 0.5) electrons/keV, respectively, in agreement with oth...
First Dark Matter Search with Nuclear Recoils from the XENONnT Experiment
Aprile, E.; Abe, K.; Agostini, F.; Ahmed Maouloud, S.; Althueser, L.; Andrieu, B.; Angelino, E.; Angevaare, J. R.; Antochi, V. C.; Antón Martin, D.Limit points are included in the submission file; We report on the first search for nuclear recoils from dark matter in the form of weakly interacting massive particles (WIMPs) with the XENONnT experiment, which is based on a two-phase time projection chamber with a sensitive liquid xenon mass of 5.9 ton. During the (1.09±0.03) ton yr exposure used for this search, the intrinsic ^{85}Kr and ^{222}Rn concentrat...
Microbial strain characterisation by MALDI-TOF MS - possibilities and limits
Kallow, W.; Erhard, M.; Lima, Nelson; Santos, Isabel M.; Serra, Rita; Venâncio, Armando; Friedl, T.; Müller, J.; Hoog, G. S. de; Verkley, G. J. M.