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A critical-point yield model to appraise the damage caused to soybean by white-...
Reis, Erlei M.; Zanatta, Mateus; Juliatti, Fernando Cezar; Campos, Hercules D.; Silva, Luis Henrique Carregal P.; Meyer, Maurício C.; Nunes Junior, JoséA model to estimate the damage caused by white mold to soybean yield from experimental field data gathered during the summer season of 2009-10 was generated. Six soybean cultivars were grown on six sites of the Cerrados region, resulting in a total of nine separate experiments. The gradient of disease intensity (plant stem incidence) and yield was generated through the application of different fungicides and ra...
Date: 2020
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Origin: Oasisbr