A set of silver-doped indium sulphide (In2S3:Ag) thin films were deposited by spray pyrolysis technique, at 350 degrees C, to analyze the effects of the Ag doping on the physical properties of the films. Within the limits of the analyzed dopant concentration, X-ray diffraction (XRD) revealed the polycrystalline nature of the films, crystalizing in the beta-In2S3 cubic phase, regardless the level of doping. Both...