This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF-sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic ge...