Document details

Influence of quantum-dots density on average in-plane strain of optoelectronic devices investigated by high-resolution X-ray diffraction

Author(s): Morelhão, Sérgio Luiz

Date: 2009

Origin: Oasisbr

Subject(s): DIFRAÇÃO POR RAIOS X; DIFRAÇÃO POR RAIOS X; DIFRAÇÃO POR RAIOS X


Document Type Other
Language English
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