Author(s):
Lima, E. C. ; Araujo, E. B. [UNESP] ; Eiras, J. A.
Date: 2020
Persistent ID: http://hdl.handle.net/11449/200303
Origin: Oasisbr
Subject(s): nonlinear dielectric properties; permittivity; PZT thin films; nonlinear dielectric properties; nonlinear dielectric properties; permittivity; permittivity; PZT thin films; PZT thin films
Description
Made available in DSpace on 2020-12-12T02:03:01Z (GMT). No. of bitstreams: 0 Previous issue date: 2020-02-17
The intrinsic contribution of dielectric permittivity was obtained in thin films of PZT pyrolyzed at different temperatures. Pyrochlore phases were observed in films pyrolyzed at temperatures above 350 °C, while only the perovskite phase grows in films pyrolyzed at temperatures lower than 300 °C. Dielectric and ferroelectric properties were characterized, and their behaviors were related to pyrolysis temperature. The dielectric permittivity dependence on the bias electric field was investigated at room temperature for different PZT thin films, and these curves were used to reconstruct the hysteresis loops. In this work, a model was used to reconstruct the hysteretic behavior of the films. The experimental results are in excellent agreement with the applied model.
Universidade Federal do Tocantins
Departamento de Física e Química Faculdade de Engenharia de Ilha Solteira Universidade Estadual Paulista–UNESP
Grupo de Materiais Ferroicos. Departamento de Física Universidade Federal de São Carlos
Departamento de Física e Química Faculdade de Engenharia de Ilha Solteira Universidade Estadual Paulista–UNESP