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Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor

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Resumo:This paper studies the deposition of thin silicon films from silane on plastic substrates in a recently build hot-wire chemical vapor deposition reactor. Hydrogen dilution of silane was used to induce amorphous-to-nanocrystalline phase transition. Thin-film deposition rate, r(d), is roughly proportional to silane concentration during deposition but the proportionality factor depends on filament temperature, T-fil. At T-fil similar to 2500 degrees C (1900 degrees C), r(d) increases from 2.1 angstrom/s (1.2 angstrom/s) at 97% H-2 dilution to 14.5 angstrom/s (10.7 angstrom/s) for films deposited from pure silane. At T-fil similar to 2500 degrees C, films deposited under 80% H-2 dilution were amorphous, under 90% H-2 dilution the crystalline fraction was X-C = 49.4% and under 95% H-2 dilution, X-C = 52.8%. At T-fil similar to 1900 degrees C, samples were amorphous up to similar to 95% H-2 dilution where a crystalline fraction of 22.3% was measured. Films with amorphous structure have sigma(d) similar to 10(-10)-10(-9) Omega(-1.)cm(-1) while those with a measured crystalline fraction have sigma(d)similar to 10(-7)-10(-5) Omega(-1)cm(-1), depending on the amount of crystalline fraction and grain size. Films with lower sigma(d) have optical band gap in the range similar to 1.85-1.9 eV, typical of hydrogenated amorphous silicon, while those with higher sigma(d) have larger optical band gap (similar to 2 eV), typical of hydrogenated nanocrystalline silicon. Adhesion of the films to the plastic substrate was good, as they survived bending to small radius of curvature (< 1 mm) without peeling. Structural, optical and transport properties were similar on films deposited both on PEN and on glass under the same deposition conditions.
Autores principais:Alpuim, P.
Outros Autores:Ribeiro, M.; Filonovich, Sergej
Assunto:Nanocrystalline silicon Hot-wire CVD Flexible electronics Thin-film solar cell
Ano:2006
País:Portugal
Tipo de documento:comunicação em conferência
Tipo de acesso:acesso aberto
Instituição associada:Universidade do Minho
Idioma:inglês
Origem:RepositóriUM - Universidade do Minho
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author Alpuim, P.
author2 Ribeiro, M.
Filonovich, Sergej
author2_role author
author
author_facet Alpuim, P.
Ribeiro, M.
Filonovich, Sergej
author_role author
contributor_name_str_mv Universidade do Minho
country_str PT
creators_json_txt [{\"Person.name\":\"Alpuim, P.\"},{\"Person.name\":\"Ribeiro, M.\"},{\"Person.name\":\"Filonovich, Sergej\"}]
datacite.contributors.contributor.contributorName.fl_str_mv Universidade do Minho
datacite.creators.creator.creatorName.fl_str_mv Alpuim, P.
Ribeiro, M.
Filonovich, Sergej
datacite.date.Accepted.fl_str_mv 2006-01-01T00:00:00Z
datacite.date.available.fl_str_mv 2006-09-15T09:52:25Z
datacite.date.embargoed.fl_str_mv 2006-09-15T09:52:25Z
datacite.rights.fl_str_mv http://purl.org/coar/access_right/c_abf2
datacite.subjects.subject.fl_str_mv Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
datacite.titles.title.fl_str_mv Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
dc.contributor.none.fl_str_mv Universidade do Minho
dc.creator.none.fl_str_mv Alpuim, P.
Ribeiro, M.
Filonovich, Sergej
dc.date.Accepted.fl_str_mv 2006-01-01T00:00:00Z
dc.date.available.fl_str_mv 2006-09-15T09:52:25Z
dc.date.embargoed.fl_str_mv 2006-09-15T09:52:25Z
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv https://hdl.handle.net/1822/5554
dc.language.none.fl_str_mv eng
dc.publisher.none.fl_str_mv Trans Tech Publications
dc.rights.none.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.subject.none.fl_str_mv Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
dc.title.fl_str_mv Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
dc.type.none.fl_str_mv http://purl.org/coar/resource_type/c_5794
description This paper studies the deposition of thin silicon films from silane on plastic substrates in a recently build hot-wire chemical vapor deposition reactor. Hydrogen dilution of silane was used to induce amorphous-to-nanocrystalline phase transition. Thin-film deposition rate, r(d), is roughly proportional to silane concentration during deposition but the proportionality factor depends on filament temperature, T-fil. At T-fil similar to 2500 degrees C (1900 degrees C), r(d) increases from 2.1 angstrom/s (1.2 angstrom/s) at 97% H-2 dilution to 14.5 angstrom/s (10.7 angstrom/s) for films deposited from pure silane. At T-fil similar to 2500 degrees C, films deposited under 80% H-2 dilution were amorphous, under 90% H-2 dilution the crystalline fraction was X-C = 49.4% and under 95% H-2 dilution, X-C = 52.8%. At T-fil similar to 1900 degrees C, samples were amorphous up to similar to 95% H-2 dilution where a crystalline fraction of 22.3% was measured. Films with amorphous structure have sigma(d) similar to 10(-10)-10(-9) Omega(-1.)cm(-1) while those with a measured crystalline fraction have sigma(d)similar to 10(-7)-10(-5) Omega(-1)cm(-1), depending on the amount of crystalline fraction and grain size. Films with lower sigma(d) have optical band gap in the range similar to 1.85-1.9 eV, typical of hydrogenated amorphous silicon, while those with higher sigma(d) have larger optical band gap (similar to 2 eV), typical of hydrogenated nanocrystalline silicon. Adhesion of the films to the plastic substrate was good, as they survived bending to small radius of curvature (< 1 mm) without peeling. Structural, optical and transport properties were similar on films deposited both on PEN and on glass under the same deposition conditions.
dirty 0
eu_rights_str_mv openAccess
format conferencePaper
fulltext.url.fl_str_mv https://prod-dspace.uminho.pt/bitstreams/9a57f8a1-7f99-44a9-9f24-c413161b93eb/download
id rum_b61d8452fdd41434e33a1ebc8e2ff41b
identifier.url.fl_str_mv https://hdl.handle.net/1822/5554
instacron_str repositorium
institution Universidade do Minho
instname_str Universidade do Minho
language eng
network_acronym_str rum
network_name_str RepositóriUM - Universidade do Minho
oai_identifier_str oai:repositorium.uminho.pt:1822/5554
organization_str_mv urn:organizationAcronym:repositorium
person_str_mv Alpuim, P.
Ribeiro, M.
Filonovich, Sergej
publishDate 2006
publisher.none.fl_str_mv Trans Tech Publications
reponame_str RepositóriUM - Universidade do Minho
repository_id_str urn:repositoryAcronym:rum
service_str_mv urn:repositoryAcronym:rum
spelling engTrans Tech PublicationsengThis paper studies the deposition of thin silicon films from silane on plastic substrates in a recently build hot-wire chemical vapor deposition reactor. Hydrogen dilution of silane was used to induce amorphous-to-nanocrystalline phase transition. Thin-film deposition rate, r(d), is roughly proportional to silane concentration during deposition but the proportionality factor depends on filament temperature, T-fil. At T-fil similar to 2500 degrees C (1900 degrees C), r(d) increases from 2.1 angstrom/s (1.2 angstrom/s) at 97% H-2 dilution to 14.5 angstrom/s (10.7 angstrom/s) for films deposited from pure silane. At T-fil similar to 2500 degrees C, films deposited under 80% H-2 dilution were amorphous, under 90% H-2 dilution the crystalline fraction was X-C = 49.4% and under 95% H-2 dilution, X-C = 52.8%. At T-fil similar to 1900 degrees C, samples were amorphous up to similar to 95% H-2 dilution where a crystalline fraction of 22.3% was measured. Films with amorphous structure have sigma(d) similar to 10(-10)-10(-9) Omega(-1.)cm(-1) while those with a measured crystalline fraction have sigma(d)similar to 10(-7)-10(-5) Omega(-1)cm(-1), depending on the amount of crystalline fraction and grain size. Films with lower sigma(d) have optical band gap in the range similar to 1.85-1.9 eV, typical of hydrogenated amorphous silicon, while those with higher sigma(d) have larger optical band gap (similar to 2 eV), typical of hydrogenated nanocrystalline silicon. Adhesion of the films to the plastic substrate was good, as they survived bending to small radius of curvature (< 1 mm) without peeling. Structural, optical and transport properties were similar on films deposited both on PEN and on glass under the same deposition conditions.application/pdfengOptimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactorAlpuim, P.Ribeiro, M.Filonovich, SergejHostingInstitutionOrganizationalUniversidade do Minhoe-mailmailto:repositorium@usdb.uminho.ptrepositorium@usdb.uminho.ptISBNIsPartOf9780878494026ISSNIsPartOf0255-5476DOIIsPartOf10.4028/www.scientific.net/msf.514-516.4752006-09-15T09:52:25Z20062006-01-01T00:00:00ZHandlehttps://hdl.handle.net/1822/5554http://purl.org/coar/access_right/c_abf2open accessNanocrystalline siliconHot-wire CVDFlexible electronicsThin-film solar cell146231 bytesother research producthttp://purl.org/coar/resource_type/c_5794conference paperhttp://purl.org/coar/access_right/c_abf2application/pdffulltexthttps://prod-dspace.uminho.pt/bitstreams/9a57f8a1-7f99-44a9-9f24-c413161b93eb/download
spellingShingle Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
Alpuim, P.
Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
status SINGLETON
subject.fl_str_mv Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
title Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
title_full Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
title_fullStr Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
title_full_unstemmed Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
title_short Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
title_sort Optimization of deposition parameters for thin silicon films on flexible substrates in a hot-wire chemical vapor deposition reactor
topic Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
topic_facet Nanocrystalline silicon
Hot-wire CVD
Flexible electronics
Thin-film solar cell
url https://hdl.handle.net/1822/5554
visible 1