Publicação
Structure and optical properties of ZnO:V thin films with different doping concentration
| Resumo: | A series of ZnO thin films doped with various vanadium concentrations were prepared on glass substrates by direct current reactive magnetron sputtering. The results of the X-ray diffraction (XRD) show that the films with doping concentration less than 10 at.% have a wurtzite structure and grow mainly along the c-axis orientation. The residual stress, estimated by fitting the XRD diffraction peaks, increases with the doping concentration and the grain size also has been calculated from the XRD results, decreases with increasing the doping concentration. The surface morphology of the ZnO:V thin films was examined by SEM. The optical constants (refractive index and extinction coefficient) and the film thickness have been obtained by fitting the transmittance. The optical band gap changed from 3.12 eV to 3.60 eV as doping concentration increased from 1.8 at.% to 13 at.% mol. All the results have been discussed in relation with doping concentration |
|---|---|
| Autores principais: | Wang Li-Wei |
| Outros Autores: | Meng Lijian; Teixeira, Vasco M. P.; Song Shigeng; Xu Zheng; Xu Xu-Rong |
| Assunto: | V-doped ZnO Magnetron sputtering Optical properties |
| Ano: | 2009 |
| País: | Portugal |
| Tipo de documento: | artigo |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade do Minho |
| Idioma: | inglês |
| Origem: | RepositóriUM - Universidade do Minho |
| _version_ | 1866876998879543296 |
|---|---|
| author | Wang Li-Wei |
| author2 | Meng Lijian Teixeira, Vasco M. P. Song Shigeng Xu Zheng Xu Xu-Rong |
| author2_role | author author author author author |
| author_facet | Wang Li-Wei Meng Lijian Teixeira, Vasco M. P. Song Shigeng Xu Zheng Xu Xu-Rong |
| author_role | author |
| contributor_name_str_mv | Universidade do Minho |
| country_str | PT |
| creators_json_txt | [{\"Person.name\":\"Wang Li-Wei\"},{\"Person.name\":\"Meng Lijian\"},{\"Person.name\":\"Teixeira, Vasco M. P.\"},{\"Person.name\":\"Song Shigeng\"},{\"Person.name\":\"Xu Zheng\"},{\"Person.name\":\"Xu Xu-Rong\"}] |
| datacite.contributors.contributor.contributorName.fl_str_mv | Universidade do Minho |
| datacite.creators.creator.creatorName.fl_str_mv | Wang Li-Wei Meng Lijian Teixeira, Vasco M. P. Song Shigeng Xu Zheng Xu Xu-Rong |
| datacite.date.Accepted.fl_str_mv | 2009-05-01T00:00:00Z |
| datacite.date.available.fl_str_mv | 2011-09-19T13:43:30Z |
| datacite.date.embargoed.fl_str_mv | 2011-09-19T13:43:30Z |
| datacite.rights.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| datacite.subjects.subject.fl_str_mv | V-doped ZnO Magnetron sputtering Optical properties |
| datacite.titles.title.fl_str_mv | Structure and optical properties of ZnO:V thin films with different doping concentration |
| dc.contributor.none.fl_str_mv | Universidade do Minho |
| dc.creator.none.fl_str_mv | Wang Li-Wei Meng Lijian Teixeira, Vasco M. P. Song Shigeng Xu Zheng Xu Xu-Rong |
| dc.date.Accepted.fl_str_mv | 2009-05-01T00:00:00Z |
| dc.date.available.fl_str_mv | 2011-09-19T13:43:30Z |
| dc.date.embargoed.fl_str_mv | 2011-09-19T13:43:30Z |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | https://hdl.handle.net/1822/13627 |
| dc.language.none.fl_str_mv | eng |
| dc.publisher.none.fl_str_mv | Elsevier |
| dc.rights.none.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| dc.subject.none.fl_str_mv | V-doped ZnO Magnetron sputtering Optical properties |
| dc.title.fl_str_mv | Structure and optical properties of ZnO:V thin films with different doping concentration |
| dc.type.none.fl_str_mv | http://purl.org/coar/resource_type/c_6501 |
| description | A series of ZnO thin films doped with various vanadium concentrations were prepared on glass substrates by direct current reactive magnetron sputtering. The results of the X-ray diffraction (XRD) show that the films with doping concentration less than 10 at.% have a wurtzite structure and grow mainly along the c-axis orientation. The residual stress, estimated by fitting the XRD diffraction peaks, increases with the doping concentration and the grain size also has been calculated from the XRD results, decreases with increasing the doping concentration. The surface morphology of the ZnO:V thin films was examined by SEM. The optical constants (refractive index and extinction coefficient) and the film thickness have been obtained by fitting the transmittance. The optical band gap changed from 3.12 eV to 3.60 eV as doping concentration increased from 1.8 at.% to 13 at.% mol. All the results have been discussed in relation with doping concentration |
| dirty | 0 |
| eu_rights_str_mv | openAccess |
| format | article |
| fulltext.url.fl_str_mv | https://prod-dspace.uminho.pt/bitstreams/0548ef8e-8bfb-4a39-b7dd-7692423f2dee/download |
| id | rum_e3d4f4172d54eaeebf8a411ad2fc94fe |
| identifier.url.fl_str_mv | https://hdl.handle.net/1822/13627 |
| instacron_str | repositorium |
| institution | Universidade do Minho |
| instname_str | Universidade do Minho |
| language | eng |
| network_acronym_str | rum |
| network_name_str | RepositóriUM - Universidade do Minho |
| oai_identifier_str | oai:repositorium.uminho.pt:1822/13627 |
| organization_str_mv | urn:organizationAcronym:repositorium |
| person_str_mv | Wang Li-Wei Meng Lijian Teixeira, Vasco M. P. Song Shigeng Xu Zheng Xu Xu-Rong |
| publishDate | 2009 |
| publisher.none.fl_str_mv | Elsevier |
| reponame_str | RepositóriUM - Universidade do Minho |
| repository_id_str | urn:repositoryAcronym:rum |
| service_str_mv | urn:repositoryAcronym:rum |
| spelling | engElsevierporA series of ZnO thin films doped with various vanadium concentrations were prepared on glass substrates by direct current reactive magnetron sputtering. The results of the X-ray diffraction (XRD) show that the films with doping concentration less than 10 at.% have a wurtzite structure and grow mainly along the c-axis orientation. The residual stress, estimated by fitting the XRD diffraction peaks, increases with the doping concentration and the grain size also has been calculated from the XRD results, decreases with increasing the doping concentration. The surface morphology of the ZnO:V thin films was examined by SEM. The optical constants (refractive index and extinction coefficient) and the film thickness have been obtained by fitting the transmittance. The optical band gap changed from 3.12 eV to 3.60 eV as doping concentration increased from 1.8 at.% to 13 at.% mol. All the results have been discussed in relation with doping concentrationapplication/pdfporStructure and optical properties of ZnO:V thin films with different doping concentrationWang Li-WeiMeng LijianTeixeira, Vasco M. P.Song ShigengXu ZhengXu Xu-RongHostingInstitutionOrganizationalUniversidade do Minhoe-mailmailto:repositorium@usdb.uminho.ptrepositorium@usdb.uminho.ptISSNIsPartOf0040-6090DOIIsPartOf10.1016/j.tsf.2008.12.0432011-09-19T13:43:30Z2009-052008-012009-05-01T00:00:00ZHandlehttps://hdl.handle.net/1822/13627http://purl.org/coar/access_right/c_abf2open accessV-doped ZnOMagnetron sputteringOptical properties1227266 bytesliteraturehttp://purl.org/coar/resource_type/c_6501journal articlehttp://purl.org/coar/access_right/c_abf2application/pdffulltexthttps://prod-dspace.uminho.pt/bitstreams/0548ef8e-8bfb-4a39-b7dd-7692423f2dee/download |
| spellingShingle | Structure and optical properties of ZnO:V thin films with different doping concentration Wang Li-Wei V-doped ZnO Magnetron sputtering Optical properties |
| status | SINGLETON |
| subject.fl_str_mv | V-doped ZnO Magnetron sputtering Optical properties |
| title | Structure and optical properties of ZnO:V thin films with different doping concentration |
| title_full | Structure and optical properties of ZnO:V thin films with different doping concentration |
| title_fullStr | Structure and optical properties of ZnO:V thin films with different doping concentration |
| title_full_unstemmed | Structure and optical properties of ZnO:V thin films with different doping concentration |
| title_short | Structure and optical properties of ZnO:V thin films with different doping concentration |
| title_sort | Structure and optical properties of ZnO:V thin films with different doping concentration |
| topic | V-doped ZnO Magnetron sputtering Optical properties |
| topic_facet | V-doped ZnO Magnetron sputtering Optical properties |
| url | https://hdl.handle.net/1822/13627 |
| visible | 1 |