Publicação
3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program
| Resumo: | Numerical simulation of a Bayard-Alpert ionisation gauge using SIMION 8.1 software is presented. Gauge sensitivity, being the most important parameter of an ionisation gauge, has been derived using two different approaches. In the first one, SIMION is used to determine mean length of electron trajectories, and ion collection efficiency. From these values, known ionisation cross sections and the gas temperature, the sensitivity can be readily calculated. In the second and more detailed approach, a Monte Carlo method was implemented in the Lua programming language to simulate electron impact ionisation of the gas. The Lua code is incorporated in the SIMION trajectory simulations, in which the ionisation event is modelled by transforming a primary electron into an ion. This approach evaluates the contribution of each trajectory to the gas ionisation. It considers energy dependence of the ionisation probability and the contribution of the electrons backscattered from the grid to the sensitivity. The simulation approaches were tested on the gauge geometry, recently modelled by the CERN group. Very good quantitative agreement with the CERN simulations was obtained using both approaches. Monte Carlo simulations reveal that the relative contribution of electrons backscattered from molybdenum grid to the sensitivity is about 14%. |
|---|---|
| Autores principais: | Silva, Ricardo |
| Outros Autores: | Bundaleski, Nenad; Fonseca, Ana L.; Teodoro, Orlando M. N. D. |
| Assunto: | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| Ano: | 2019 |
| País: | Portugal |
| Tipo de documento: | artigo |
| Tipo de acesso: | acesso aberto |
| Instituição associada: | Universidade Nova de Lisboa |
| Idioma: | inglês |
| Origem: | Repositório Institucional da UNL |
| _version_ | 1868983089735139328 |
|---|---|
| author | Silva, Ricardo |
| author2 | Bundaleski, Nenad Fonseca, Ana L. Teodoro, Orlando M. N. D. |
| author2_role | author author author |
| author_facet | Silva, Ricardo Bundaleski, Nenad Fonseca, Ana L. Teodoro, Orlando M. N. D. |
| author_role | author |
| contributor_name_str_mv | CeFITec – Centro de Física e Investigação Tecnológica DF – Departamento de Física Elsevier RUN |
| country_str | PT |
| creators_json_txt | [{\"Person.name\":\"Silva, Ricardo\"},{\"Person.name\":\"Bundaleski, Nenad\"},{\"Person.name\":\"Fonseca, Ana L.\"},{\"Person.name\":\"Teodoro, Orlando M. N. D.\"}] |
| datacite.contributors.contributor.contributorName.fl_str_mv | CeFITec – Centro de Física e Investigação Tecnológica DF – Departamento de Física Elsevier RUN |
| datacite.creators.creator.creatorName.fl_str_mv | Silva, Ricardo Bundaleski, Nenad Fonseca, Ana L. Teodoro, Orlando M. N. D. |
| datacite.date.Accepted.fl_str_mv | 2019-06-01T00:00:00Z |
| datacite.date.available.fl_str_mv | 2019-07-29T22:39:18Z |
| datacite.date.embargoed.fl_str_mv | 2019-07-29T22:39:18Z |
| datacite.rights.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| datacite.subjects.subject.fl_str_mv | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| datacite.titles.title.fl_str_mv | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| dc.contributor.none.fl_str_mv | CeFITec – Centro de Física e Investigação Tecnológica DF – Departamento de Física Elsevier RUN |
| dc.creator.none.fl_str_mv | Silva, Ricardo Bundaleski, Nenad Fonseca, Ana L. Teodoro, Orlando M. N. D. |
| dc.date.Accepted.fl_str_mv | 2019-06-01T00:00:00Z |
| dc.date.available.fl_str_mv | 2019-07-29T22:39:18Z |
| dc.date.embargoed.fl_str_mv | 2019-07-29T22:39:18Z |
| dc.format.none.fl_str_mv | application/pdf |
| dc.identifier.none.fl_str_mv | http://www.scopus.com/inward/record.url?scp=85063337023&partnerID=8YFLogxK |
| dc.language.none.fl_str_mv | eng |
| dc.rights.none.fl_str_mv | http://purl.org/coar/access_right/c_abf2 |
| dc.subject.none.fl_str_mv | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| dc.title.fl_str_mv | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| dc.type.none.fl_str_mv | http://purl.org/coar/resource_type/c_6501 |
| description | Numerical simulation of a Bayard-Alpert ionisation gauge using SIMION 8.1 software is presented. Gauge sensitivity, being the most important parameter of an ionisation gauge, has been derived using two different approaches. In the first one, SIMION is used to determine mean length of electron trajectories, and ion collection efficiency. From these values, known ionisation cross sections and the gas temperature, the sensitivity can be readily calculated. In the second and more detailed approach, a Monte Carlo method was implemented in the Lua programming language to simulate electron impact ionisation of the gas. The Lua code is incorporated in the SIMION trajectory simulations, in which the ionisation event is modelled by transforming a primary electron into an ion. This approach evaluates the contribution of each trajectory to the gas ionisation. It considers energy dependence of the ionisation probability and the contribution of the electrons backscattered from the grid to the sensitivity. The simulation approaches were tested on the gauge geometry, recently modelled by the CERN group. Very good quantitative agreement with the CERN simulations was obtained using both approaches. Monte Carlo simulations reveal that the relative contribution of electrons backscattered from molybdenum grid to the sensitivity is about 14%. |
| dirty | 0 |
| eu_rights_str_mv | openAccess |
| format | article |
| fulltext.url.fl_str_mv | https://run.unl.pt/bitstreams/2a4886cf-6591-4a46-bd9c-ec2ca66b9d30/download |
| id | run_2ff260cdebfc2b751a9f2cd19e9ba79c |
| identifier.url.fl_str_mv | http://www.scopus.com/inward/record.url?scp=85063337023&partnerID=8YFLogxK |
| inst_facet_str | urn:organizationAcronym:unl{{{_:::_}}}Universidade Nova de Lisboa |
| instacron_str | unl |
| institution | Universidade Nova de Lisboa |
| instname_str | Universidade Nova de Lisboa |
| language | eng |
| network_acronym_str | run |
| network_name_str | Repositório Institucional da UNL |
| oai_identifier_str | oai:run.unl.pt:10362/76911 |
| organization_str_mv | urn:organizationAcronym:unl |
| person_str_mv | Silva, Ricardo Bundaleski, Nenad Fonseca, Ana L. Teodoro, Orlando M. N. D. |
| publishDate | 2019 |
| repo_facet_str | urn:repositoryAcronym:run{{{_:::_}}}Repositório Institucional da UNL |
| reponame_str | Repositório Institucional da UNL |
| repository_id_str | urn:repositoryAcronym:run |
| service_str_mv | urn:repositoryAcronym:run |
| spelling | engenNumerical simulation of a Bayard-Alpert ionisation gauge using SIMION 8.1 software is presented. Gauge sensitivity, being the most important parameter of an ionisation gauge, has been derived using two different approaches. In the first one, SIMION is used to determine mean length of electron trajectories, and ion collection efficiency. From these values, known ionisation cross sections and the gas temperature, the sensitivity can be readily calculated. In the second and more detailed approach, a Monte Carlo method was implemented in the Lua programming language to simulate electron impact ionisation of the gas. The Lua code is incorporated in the SIMION trajectory simulations, in which the ionisation event is modelled by transforming a primary electron into an ion. This approach evaluates the contribution of each trajectory to the gas ionisation. It considers energy dependence of the ionisation probability and the contribution of the electrons backscattered from the grid to the sensitivity. The simulation approaches were tested on the gauge geometry, recently modelled by the CERN group. Very good quantitative agreement with the CERN simulations was obtained using both approaches. Monte Carlo simulations reveal that the relative contribution of electrons backscattered from molybdenum grid to the sensitivity is about 14%.application/pdfen3D-Simulation of a Bayard Alpert ionisation gauge using SIMION programSilva, RicardoBundaleski, NenadFonseca, Ana L.Teodoro, Orlando M. N. D.CeFITec – Centro de Física e Investigação TecnológicaDF – Departamento de FísicaElsevierHostingInstitutionOrganizationalRUNe-mailmailto:run@unl.ptrun@unl.ptISSNIsPartOf0042-207XURNIsPartOfPURE: 13373689URNIsPartOfPURE UUID: f8b9bbab-91b6-452b-b804-732e329b23acURNIsPartOfScopus: 85063337023URNIsPartOfWOS: 000467510900046URNIsPartOfORCID: /0000-0002-3424-2847/work/85867903DOIIsPartOf10.1016/j.vacuum.2019.03.0392019-07-29T22:39:18Z2019-06-012019-06-01T00:00:00ZURLhttp://www.scopus.com/inward/record.url?scp=85063337023&partnerID=8YFLogxKhttp://purl.org/coar/access_right/c_abf2open accessGauge sensitivityIonisation gaugeSimulationVacuum measurementInstrumentationCondensed Matter PhysicsSurfaces, Coatings and Films1950859 bytesliteraturehttp://purl.org/coar/resource_type/c_6501journal articlehttp://purl.org/coar/access_right/c_abf2application/pdffulltexthttps://run.unl.pt/bitstreams/2a4886cf-6591-4a46-bd9c-ec2ca66b9d30/download |
| spellingShingle | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program Silva, Ricardo Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| status | SINGLETON |
| subject.fl_str_mv | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| title | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| title_full | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| title_fullStr | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| title_full_unstemmed | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| title_short | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| title_sort | 3D-Simulation of a Bayard Alpert ionisation gauge using SIMION program |
| topic | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| topic_facet | Gauge sensitivity Ionisation gauge Simulation Vacuum measurement Instrumentation Condensed Matter Physics Surfaces, Coatings and Films |
| url | http://www.scopus.com/inward/record.url?scp=85063337023&partnerID=8YFLogxK |
| visible | 1 |