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Development of a Force Feedback Microscope

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Summary:In this thesis we report the development of the force feedback microscopy technique, an alternative methodology to the conventional atomic force microscope. This novel technique replaces some core instrumental subsystems of conventional AFMs, leading to several key differences in its function, which were explored during the work performed. We report here the development of a prototype of this instrument, specifically designed to showcase the key advantages of the force feedback microscopy technique. The new instrument was the object of a comprehensive characterization, with the development of several calibration protocols which took advantages of the technique’s main valences to provide direct, traceable measurements of the instrument performance. Finally, we showcase the use of the microscope in the experimental study of several systems which use and take advantage of main specific characteristics of the force feedback methodology. Topics such as nanofriction, capillary condensation, nanomechanics or protein-protein interactions were analyzed with the new instrument, showing that this technique is especially tuned for the study of interactions at the nanoscale.
Main Authors:Vitorino, Miguel V
Subject:Nanotechnology Atomic Force Microscopy Instrumentation Nanometrology Soft Matter
Year:2020
Country:Portugal
Document type:doctoral thesis
Access type:open access
Associated institution:Universidade de Lisboa
Language:English
Origin:Repositório da Universidade de Lisboa
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author Vitorino, Miguel V
author_facet Vitorino, Miguel V
author_role author
contributor_name_str_mv Rodrigues, Mário Manuel Silveira
Godinho, Maria Margarida da Fonseca Beja
Repositório Científico de Acesso Aberto da ULisboa
country_str PT
creators_json_txt [{\"Person.name\":\"Vitorino, Miguel V\",\"Person.identifier.orcid\":\"0000-0002-6821-4481\"}]
datacite.contributors.contributor.contributorName.fl_str_mv Rodrigues, Mário Manuel Silveira
Godinho, Maria Margarida da Fonseca Beja
Repositório Científico de Acesso Aberto da ULisboa
datacite.creators.creator.creatorName.fl_str_mv Vitorino, Miguel V
datacite.date.Accepted.fl_str_mv 2020-02-01T00:00:00Z
datacite.date.available.fl_str_mv 2020-07-27T10:48:44Z
datacite.date.embargoed.fl_str_mv 2020-07-27T10:48:44Z
datacite.rights.fl_str_mv http://purl.org/coar/access_right/c_abf2
datacite.subjects.subject.fl_str_mv Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
datacite.titles.title.fl_str_mv Development of a Force Feedback Microscope
dc.contributor.none.fl_str_mv Rodrigues, Mário Manuel Silveira
Godinho, Maria Margarida da Fonseca Beja
Repositório Científico de Acesso Aberto da ULisboa
dc.creator.none.fl_str_mv Vitorino, Miguel V
dc.date.Accepted.fl_str_mv 2020-02-01T00:00:00Z
dc.date.available.fl_str_mv 2020-07-27T10:48:44Z
dc.date.embargoed.fl_str_mv 2020-07-27T10:48:44Z
dc.format.none.fl_str_mv application/pdf
dc.identifier.none.fl_str_mv http://hdl.handle.net/10451/44161
dc.language.none.fl_str_mv eng
dc.rights.none.fl_str_mv http://purl.org/coar/access_right/c_abf2
dc.subject.none.fl_str_mv Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
dc.title.fl_str_mv Development of a Force Feedback Microscope
dc.type.none.fl_str_mv http://purl.org/coar/resource_type/c_db06
description In this thesis we report the development of the force feedback microscopy technique, an alternative methodology to the conventional atomic force microscope. This novel technique replaces some core instrumental subsystems of conventional AFMs, leading to several key differences in its function, which were explored during the work performed. We report here the development of a prototype of this instrument, specifically designed to showcase the key advantages of the force feedback microscopy technique. The new instrument was the object of a comprehensive characterization, with the development of several calibration protocols which took advantages of the technique’s main valences to provide direct, traceable measurements of the instrument performance. Finally, we showcase the use of the microscope in the experimental study of several systems which use and take advantage of main specific characteristics of the force feedback methodology. Topics such as nanofriction, capillary condensation, nanomechanics or protein-protein interactions were analyzed with the new instrument, showing that this technique is especially tuned for the study of interactions at the nanoscale.
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eu_rights_str_mv openAccess
format doctoralThesis
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funding.funder.alternateName_str_mv FCT
funding.funder.identifier_str_mv http://doi.org/10.13039/501100001871
funding.funder.name_str_mv Fundação para a Ciência e a Tecnologia
funding.name_str_mv FARH
id ul_a3d2ddb97b2e2e0900527611b46dc776
identifier.url.fl_str_mv http://hdl.handle.net/10451/44161
instacron_str ul
institution Universidade de Lisboa
instname_str Universidade de Lisboa
language eng
network_acronym_str ul
network_name_str Repositório da Universidade de Lisboa
oai_identifier_str oai:repositorio.ulisboa.pt:10451/44161
organization_str_mv urn:organizationAcronym:ul
person_str_mv Vitorino, Miguel V
Vitorino, Miguel V
https://www.ciencia-id.pt/5C1E-F475-962D
5C1E-F475-962D
http://orcid.org/0000-0002-6821-4481
0000-0002-6821-4481
publishDate 2020
reponame_str Repositório da Universidade de Lisboa
repository_id_str urn:repositoryAcronym:ul
service_str_mv urn:repositoryAcronym:ul
spelling engpt_PTIn this thesis we report the development of the force feedback microscopy technique, an alternative methodology to the conventional atomic force microscope. This novel technique replaces some core instrumental subsystems of conventional AFMs, leading to several key differences in its function, which were explored during the work performed. We report here the development of a prototype of this instrument, specifically designed to showcase the key advantages of the force feedback microscopy technique. The new instrument was the object of a comprehensive characterization, with the development of several calibration protocols which took advantages of the technique’s main valences to provide direct, traceable measurements of the instrument performance. Finally, we showcase the use of the microscope in the experimental study of several systems which use and take advantage of main specific characteristics of the force feedback methodology. Topics such as nanofriction, capillary condensation, nanomechanics or protein-protein interactions were analyzed with the new instrument, showing that this technique is especially tuned for the study of interactions at the nanoscale.application/pdfpt_PTDevelopment of a Force Feedback MicroscopePersonalVitorino, Miguel VDSpacehttp://dspace.org/items/6523f8f8-80a9-496f-85fb-611645546063DSpacehttp://dspace.org/items/6523f8f8-80a9-496f-85fb-611645546063Vargas VitorinoMiguelCiência IDhttps://www.ciencia-id.pt5C1E-F475-962DORCIDhttp://orcid.org0000-0002-6821-4481Scopus Author IDhttps://www.scopus.com56199771500Rodrigues, Mário Manuel SilveiraGodinho, Maria Margarida da Fonseca BejaHostingInstitutionOrganizationalRepositório Científico de Acesso Aberto da ULisboae-mailmailto:repositorio@reitoria.ulisboa.ptrepositorio@reitoria.ulisboa.ptURNurn:tid:1015417592020-07-27T10:48:44Z2020-022020-012020-02-01T00:00:00ZHandlehttp://hdl.handle.net/10451/44161http://purl.org/coar/access_right/c_abf2open accessNanotechnologyAtomic Force MicroscopyInstrumentationNanometrologySoft Matter128690809 bytesFundação para a Ciência e a TecnologiaA DesignarFARHCrossref Funder IDhttp://doi.org/10.13039/501100001871literaturehttp://purl.org/coar/resource_type/c_db06doctoral thesishttp://purl.org/coar/access_right/c_abf2application/pdffulltexthttps://repositorio.ulisboa.pt/bitstreams/6f8c054a-6b84-4d7b-9863-4fac580cfa73/download
spellingShingle Development of a Force Feedback Microscope
Vitorino, Miguel V
Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
status SINGLETON
subject.fl_str_mv Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
title Development of a Force Feedback Microscope
title_full Development of a Force Feedback Microscope
title_fullStr Development of a Force Feedback Microscope
title_full_unstemmed Development of a Force Feedback Microscope
title_short Development of a Force Feedback Microscope
title_sort Development of a Force Feedback Microscope
topic Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
topic_facet Nanotechnology
Atomic Force Microscopy
Instrumentation
Nanometrology
Soft Matter
url http://hdl.handle.net/10451/44161
visible 1