Author(s): Figueiras, Fábio G. ; Fernandes, J. Ramiro A. ; Silva, J. P. B. ; Alikin, Denis O. ; Queirós, Eugénia C. ; Bernardo, César Rui Freitas ; Barcelay, Y. R. ; Wrzesińska, Angelika ; Belsley, M. ; Almeida, Bernardo ; Tavares, Pedro B. ; Kholkin, Andrei L. ; Moreira, J. Agostinho ; Almeida, A.
Date: 2019
Persistent ID: https://hdl.handle.net/1822/62668
Origin: RepositóriUM - Universidade do Minho
This work reports the deposition of single phase Bi2ZnTiO6 thin films onto Pt/Si-based substrates using the RF-sputtering method and the respective structural, morphological, optical and local ferroelectric characterization. The thin film grows in the polycrystalline form with tetragonal P4mm symmetry identified by X-ray diffraction. The lack of a spatial inversion centre was confirmed by the second harmonic generation. A narrow indirect optical gap of 1.48 eV was measured using optical diffuse reflectance. The ferroelectric domain reversal was further demonstrated through piezo-response force microscopy. This work demonstrates a practical method to fabricate the BZT perovskite phase, without resorting to high pressure and temperature conditions necessary to synthetize the bulk form, with outstanding optical and ferroelectric properties.
