Oliveira, M. J. S., Silva, J. P. B., Veltruská, K., Matolín, V., Sekhar, K. C., Moreira, J. A., . . . Gomes, M. J. M. (2018). Annealing induced effect on the physical properties of ion-beam sputtered 0.5 Ba(Zr0.2Ti0.8)O3 – 0.5 (Ba0.7Ca0.3)TiO3-δ ferroelectric thin films.
Citação norma ChicagoOliveira, M. J. S., J. P. B. Silva, K. Veltruská, V. Matolín, K. C. Sekhar, J. Agostinho Moreira, M. Pereira, and M. J. M. Gomes. Annealing Induced Effect on the Physical Properties of Ion-beam Sputtered 0.5 Ba(Zr0.2Ti0.8)O3 – 0.5 (Ba0.7Ca0.3)TiO3-δ Ferroelectric Thin Films. 2018.
Citação norma MLAOliveira, M. J. S., et al. Annealing Induced Effect on the Physical Properties of Ion-beam Sputtered 0.5 Ba(Zr0.2Ti0.8)O3 – 0.5 (Ba0.7Ca0.3)TiO3-δ Ferroelectric Thin Films. 2018.