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Structural and optical studies of CdS nanocrystals embedded in silicon dioxide films

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Resumo:Silicon dioxide films doped with nanocrystallites of CdS with a mean radius value in the range of 20 to 40 A° have been grown using the magnetron rf-sputtering technique. We have studied the combined effects of rf-power deposition, the number of semiconductor chips on the SiO2 target, and post-annealing temperature on the CdS crystal size. The optical transmission spectra display a marked blue shift of the absorption band edge of up to 400 meV which was attributed to quantum size confinement effects. The luminescence spectra show a narrow emission peak tentatively explained as being due to the recombination of electrons on shallow donor levels with confined valence band holes.
Autores principais:Rolo, Anabela G.
Outros Autores:Conde, O.; Gomes, M. J. M.
Assunto:CdS-doped glass films II–VI semiconductor Rf-sputtering Quantum dots Optical absorption Photoluminescence
Ano:1998
País:Portugal
Tipo de documento:artigo
Tipo de acesso:acesso restrito
Instituição associada:Universidade do Minho
Idioma:inglês
Origem:RepositóriUM - Universidade do Minho
Descrição
Resumo:Silicon dioxide films doped with nanocrystallites of CdS with a mean radius value in the range of 20 to 40 A° have been grown using the magnetron rf-sputtering technique. We have studied the combined effects of rf-power deposition, the number of semiconductor chips on the SiO2 target, and post-annealing temperature on the CdS crystal size. The optical transmission spectra display a marked blue shift of the absorption band edge of up to 400 meV which was attributed to quantum size confinement effects. The luminescence spectra show a narrow emission peak tentatively explained as being due to the recombination of electrons on shallow donor levels with confined valence band holes.