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An ETL pattern for log configuration and analysis

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Detalhes bibliográficos
Resumo:In many scenarios, such as the ones related to Data Warehousing Extract-Transform-Load (ETL) processes, logging techniques are usually applied for capturing event metrics across system levels for system auditing and system recovery. The diversity of strategies and architectures of the toolset used to support the ETL implementation introduces another layer of complexity, both for system development and audit. Although a valuable system diagnosis resource for the development team, logging is generally underestimated, being used only when the system reveals unexpected behaviours and not to drive the ETL system evolution. We believe that the use of logs for steering ETL development and maintenance can improve significantly global system quality. However, this approach is only effective if flexible and efficient logging systems exist. In this paper, we describe a Log Pattern used in a pattern-oriented approach for ETL systems development, which provides a configurable and flexible component for using to drive ETL development and maintenance phases.
Autores principais:Oliveira, Bruno
Outros Autores:Oliveira, Óscar; Matos, Telmo; Santos, Vasco; Belo, Orlando
Assunto:Data Warehousing ETL Patterns ETL Systems Graph Databases Log Pattern Logging Process Mining
Ano:2019
País:Portugal
Tipo de documento:comunicação em conferência
Tipo de acesso:acesso restrito
Instituição associada:Universidade do Minho
Idioma:inglês
Origem:RepositóriUM - Universidade do Minho
Descrição
Resumo:In many scenarios, such as the ones related to Data Warehousing Extract-Transform-Load (ETL) processes, logging techniques are usually applied for capturing event metrics across system levels for system auditing and system recovery. The diversity of strategies and architectures of the toolset used to support the ETL implementation introduces another layer of complexity, both for system development and audit. Although a valuable system diagnosis resource for the development team, logging is generally underestimated, being used only when the system reveals unexpected behaviours and not to drive the ETL system evolution. We believe that the use of logs for steering ETL development and maintenance can improve significantly global system quality. However, this approach is only effective if flexible and efficient logging systems exist. In this paper, we describe a Log Pattern used in a pattern-oriented approach for ETL systems development, which provides a configurable and flexible component for using to drive ETL development and maintenance phases.