Publicação
Capacitors impedance measurement using Ellipse Fiitting algorithm with sub-nyquist samplig
| Resumo: | Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum. |
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| Autores principais: | Tlemçani, Mouhaydine |
| Outros Autores: | André, Albino; Hugo, G. Silva; Mourad, Bezzeghoud |
| Assunto: | capacitors ADC ellipse fitting |
| Ano: | 2014 |
| País: | Portugal |
| Tipo de documento: | artigo |
| Tipo de acesso: | acesso restrito |
| Instituição associada: | Universidade de Évora |
| Idioma: | português |
| Origem: | Repositório Científico da Universidade de Évora |
| Resumo: | Abstract—In this work, a new approach on capacitors test and characterization is presented. The technique is based on a ammeter/voltmeter measurement setup using analog to digital converters (ADC) and an ellipse fitting signal processing algorithm. The method as shown here, is robust and allows accurate measurements in a wide range of frequency spectrum. |
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